Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling

Published 2008 View Full Article

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Title
Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling
Authors
Keywords
-
Journal
Microscopy
Volume 57, Issue 6, Pages 175-179
Publisher
Oxford University Press (OUP)
Online
2008-09-25
DOI
10.1093/jmicro/dfn018

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