Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy

Title
Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy
Authors
Keywords
-
Journal
Microscopy
Volume 57, Issue 3, Pages 83-89
Publisher
Oxford University Press (OUP)
Online
2008-05-27
DOI
10.1093/jmicro/dfn008

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