Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects

Title
Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects
Authors
Keywords
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Journal
Journal of Display Technology
Volume 10, Issue 1, Pages 19-27
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-01-25
DOI
10.1109/jdt.2013.2277590

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