Journal
JOURNAL OF DISPLAY TECHNOLOGY
Volume 5, Issue 1-3, Pages 27-33Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JDT.2008.2004858
Keywords
Amorphous silicon; thin-film transistor (TFT); backplanes; testing; defects
Funding
- NIST ATP [70NANB3H3029]
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We describe a rapid testing system for active matrix thin-film transistor (TFT) backplanes which enables the identification of many common processing defects. The technique spatially maps the charge feedthrough from TFTs in the pixel and is suited for pixels with switched-capacitor architecture.
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