Microhardness and structural defects of GaSe layered semiconductor

Title
Microhardness and structural defects of GaSe layered semiconductor
Authors
Keywords
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Journal
JOURNAL OF CRYSTAL GROWTH
Volume 316, Issue 1, Pages 20-24
Publisher
Elsevier BV
Online
2010-12-16
DOI
10.1016/j.jcrysgro.2010.12.021

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