Characterization of stacking faults in thick 3C-SiC crystals using high-resolution diffuse X-ray scattering

Published 2007 View Full Article

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Title
Characterization of stacking faults in thick 3C-SiC crystals using high-resolution diffuse X-ray scattering
Authors
Keywords
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Journal
JOURNAL OF CRYSTAL GROWTH
Volume 310, Issue 5, Pages 982-987
Publisher
Elsevier BV
Online
2007-12-06
DOI
10.1016/j.jcrysgro.2007.11.149

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