Synthetic Lethality with the dut Defect in Escherichia coli Reveals Layers of DNA Damage of Increasing Complexity Due to Uracil Incorporation

Published 2008 View Full Article

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Title
Synthetic Lethality with the dut Defect in Escherichia coli Reveals Layers of DNA Damage of Increasing Complexity Due to Uracil Incorporation
Authors
Keywords
-
Journal
JOURNAL OF BACTERIOLOGY
Volume 190, Issue 17, Pages 5841-5854
Publisher
American Society for Microbiology
Online
2008-06-28
DOI
10.1128/jb.00711-08

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