Journal
JOURNAL OF APPLIED PHYSICS
Volume 116, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4890318
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- foundation for strategic research (SSF)
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We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy. (C) 2014 Author(s).
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