Nanoscale phase separation in epitaxial Cr-Mo and Cr-V alloy thin films studied using atom probe tomography: Comparison of experiments and simulation
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Title
Nanoscale phase separation in epitaxial Cr-Mo and Cr-V alloy thin films
studied using atom probe tomography: Comparison of experiments and
simulation
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 116, Issue 19, Pages 193512
Publisher
AIP Publishing
Online
2014-11-22
DOI
10.1063/1.4901465
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