A case study on the scaling of 1/f noise: La2/3Sr1/3MnO3 Thin films

The problem of anomalous scaling of the 1/f noise in thin manganite samples is revisited. It is demonstrated that the dependence of Hooge's constant on the sample width, observed by L. Mechin and co-workers [J. Appl. Phys. 103, 083709 (2008)], is naturally explained by the quantum theory of fundamental flicker noise. The true scaling of 1/f noise with the sample size is different from the inverse volume dependence, and the apparent dependence of the Hooge's constant on the sample width is the result of inadequate normalization of the voltage noise spectra. Detailed comparison of the theoretical predictions with the experimental data is given. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4794202]