AlN thin film transducers for high temperature non-destructive testing applications

Published 2012 View Full Article

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Title
AlN thin film transducers for high temperature non-destructive testing applications
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 111, Issue 7, Pages 074510
Publisher
AIP Publishing
Online
2012-04-10
DOI
10.1063/1.3700345
References
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