Low energy electron beam induced damage on InGaN/GaN quantum well structure

Published 2011 View Full Article

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Title
Low energy electron beam induced damage on InGaN/GaN quantum well structure
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 109, Issue 8, Pages 083105
Publisher
AIP Publishing
Online
2011-04-20
DOI
10.1063/1.3574655
References
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