Defect distributions in thin film solar cells deduced from admittance measurements under different bias voltages

Title
Defect distributions in thin film solar cells deduced from admittance measurements under different bias voltages
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 110, Issue 6, Pages 063722
Publisher
AIP Publishing
Online
2011-09-30
DOI
10.1063/1.3641987

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