Depth-profiling of elastic and optical inhomogeneities in transparent materials by picosecond ultrasonic interferometry: Theory

Depth-profiling of elastic inhomogeneities in transparent nanoporous low-k materials by picosecond ultrasonic interferometry

(2009) C. Mechri et al.   APPLIED PHYSICS LETTERS

Evaluation of elastic properties of nanoporous silicon oxide thin films by picosecond laser ultrasonics

(2008) C. Mechri et al.   European Physical Journal-Special Topics

Depth dependence of ultraviolet curing of organosilicate low-k thin films

(2008) Taek-Soo Kim et al.   JOURNAL OF APPLIED PHYSICS

Tuning depth profiles of organosilicate films with ultraviolet curing

(2008) Taek-Soo Kim et al.   JOURNAL OF APPLIED PHYSICS

Effect of pressure on efficiency of UV curing of CVD-derived low-k material at different wavelengths

(2008) L. Prager et al.   MICROELECTRONIC ENGINEERING

Coherent shear phonon generation and detection with picosecond laser acoustics

(2008) O. Matsuda et al.   PHYSICAL REVIEW B