Rapid thermal annealing of size-controlled Si nanocrystals: Dependence of interface defect density on thermal budget

Title
Rapid thermal annealing of size-controlled Si nanocrystals: Dependence of interface defect density on thermal budget
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 109, Issue 5, Pages 054308
Publisher
AIP Publishing
Online
2011-03-11
DOI
10.1063/1.3556449

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