Examination of Au, Cu, and Al contacts in organic field-effect transistors via displacement current measurements
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Title
Examination of Au, Cu, and Al contacts in organic field-effect transistors via displacement current measurements
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 110, Issue 6, Pages 064514
Publisher
AIP Publishing
Online
2011-10-03
DOI
10.1063/1.3638706
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