Journal
JOURNAL OF APPLIED PHYSICS
Volume 110, Issue 8, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3647779
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- College of Engineering, Purdue University
- SEMATECH Corporation
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Laser-produced plasmas (LPP) from Sn targets are seriously considered to be the light source for extreme ultraviolet (EUV) next generation lithography, and optimization of such a source will lead to improved efficiency and reduced cost of ownership of the entire lithography system. We investigated the role of reheating a prepulsed plasma and its effect on EUV conversion efficiency (CE). A 6 ns, 1.06 mu m Nd:yttrium aluminum garnet laser was used to generate the initial plasma that was then reheated by a 40 ns, 10.6 mu m CO2 laser to generate enhanced EUV emission from a planar Sn target. The effects of prepulsed laser intensity and delay timings between the prepulsed and the pumping pulse were investigated to find the optimal pre-plasma conditions before the pumping pulse. The initial optimization of these parameters resulted in 25% increase in CE from the tin LPP. The cause of increased EUV emission was identified from EUV emission spectra and ion signal data. (C) 2011 American Institute of Physics. [doi:10.1063/1.3647779]
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