In situ real-time spectroscopic ellipsometry measurement for the investigation of molecular orientation in organic amorphous multilayer structures

Published 2010 View Full Article

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Title
In situ real-time spectroscopic ellipsometry measurement for the investigation of molecular orientation in organic amorphous multilayer structures
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 12, Pages 123512
Publisher
AIP Publishing
Online
2010-06-22
DOI
10.1063/1.3432568
References
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