Effect of threading screw and edge dislocations on transport properties of 4H–SiC homoepitaxial layers

Title
Effect of threading screw and edge dislocations on transport properties of 4H–SiC homoepitaxial layers
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 108, Issue 1, Pages 013708
Publisher
AIP Publishing
Online
2010-07-09
DOI
10.1063/1.3448230

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