Characterization of thin metal films via frequency-domain thermoreflectance

Published 2010 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Characterization of thin metal films via frequency-domain thermoreflectance
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 2, Pages 024908
Publisher
AIP Publishing
Online
2010-01-28
DOI
10.1063/1.3289907
References
View 5 related references

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.