Comparative time-resolved study of the XeF2 etching of Mo and Si

Title
Comparative time-resolved study of the XeF2 etching of Mo and Si
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 108, Issue 11, Pages 114913
Publisher
AIP Publishing
Online
2010-12-14
DOI
10.1063/1.3520653

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