Physical and magnetic roughness at metal-semiconductor interface using x-ray and neutron reflectometry

Published 2010 View Full Article

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Title
Physical and magnetic roughness at metal-semiconductor interface using x-ray and neutron reflectometry
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 12, Pages 123903
Publisher
AIP Publishing
Online
2010-06-21
DOI
10.1063/1.3431389
References
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