A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging

Published 2009 View Full Article

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Title
A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 105, Issue 11, Pages 113117
Publisher
AIP Publishing
Online
2009-06-09
DOI
10.1063/1.3141727
References
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