Advantages of admittance spectroscopy over time-of-flight technique for studying dispersive charge transport in an organic semiconductor

Published 2009 View Full Article

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Title
Advantages of admittance spectroscopy over time-of-flight technique for studying dispersive charge transport in an organic semiconductor
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 106, Issue 8, Pages 083710
Publisher
AIP Publishing
Online
2009-10-29
DOI
10.1063/1.3251409
References
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