The effect of surface roughness scattering on hole mobility in double gate silicon-on-insulator devices

Published 2009 View Full Article

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Title
The effect of surface roughness scattering on hole mobility in double gate silicon-on-insulator devices
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 106, Issue 2, Pages 023705
Publisher
AIP Publishing
Online
2009-07-21
DOI
10.1063/1.3176498
References
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