Interfacial defects in resistive switching devices probed by thermal analysis

Title
Interfacial defects in resistive switching devices probed by thermal analysis
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 106, Issue 1, Pages 014504
Publisher
AIP Publishing
Online
2009-07-09
DOI
10.1063/1.3157207

Ask authors/readers for more resources

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started