X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy investigation of Al-related dipole at the HfO2/Si interface

Authors

Keywords

Journal

Volume 105, Issue 2, Pages 024102

Publisher

AIP Publishing

Online

2009-01-23

DOI

10.1063/1.3066906

References

View 3 related references

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now