Carrier lifetime measurement in n− 4H-SiC epilayers

Published 2008 View Full Article

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Title
Carrier lifetime measurement in n− 4H-SiC epilayers
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 103, Issue 3, Pages 033702
Publisher
AIP Publishing
Online
2008-02-06
DOI
10.1063/1.2837105

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