Influence of stress on the structural and dielectric properties of rf magnetron sputtered zinc oxide thin film

Title
Influence of stress on the structural and dielectric properties of rf magnetron sputtered zinc oxide thin film
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 103, Issue 9, Pages 094903
Publisher
AIP Publishing
Online
2008-05-04
DOI
10.1063/1.2903531

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now