Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites

Title
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 103, Issue 5, Pages 054505
Publisher
AIP Publishing
Online
2008-03-11
DOI
10.1063/1.2875776

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