Staebler–Wronski-like formation of defects at the amorphous-silicon–crystalline silicon interface during illumination

Published 2008 View Full Article

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Title
Staebler–Wronski-like formation of defects at the amorphous-silicon–crystalline silicon interface during illumination
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 103, Issue 9, Pages 094506
Publisher
AIP Publishing
Online
2008-05-07
DOI
10.1063/1.2913320

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