Modeling of the evolution of dielectric loss with processing temperature in ferroelectric and dielectric thin oxide films

Published 2008 View Full Article

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Title
Modeling of the evolution of dielectric loss with processing temperature in ferroelectric and dielectric thin oxide films
Authors
Keywords
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Journal
JOURNAL OF APPLIED PHYSICS
Volume 104, Issue 7, Pages 074118
Publisher
AIP Publishing
Online
2008-12-08
DOI
10.1063/1.2999638

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