Micro-Raman thermometry in the presence of complex stresses in GaN devices

Title
Micro-Raman thermometry in the presence of complex stresses in GaN devices
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 103, Issue 12, Pages 124501
Publisher
AIP Publishing
Online
2008-06-17
DOI
10.1063/1.2940131

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