The influence of growth temperature and annealing on the magnetization depth profiles across ferromagnetic/semiconductor interfaces

Published 2008 View Full Article

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Title
The influence of growth temperature and annealing on the magnetization depth profiles across ferromagnetic/semiconductor interfaces
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 104, Issue 8, Pages 083905
Publisher
AIP Publishing
Online
2008-10-25
DOI
10.1063/1.3000611

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