Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 46, Issue -, Pages 1372-1377Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889813020013
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Funding
- BMBF [03WKP03A]
- Leibniz Graduate School 'Dynamics in New Light' (DinL)
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A diffractometer setup is presented, based on a laser-driven plasma X-ray source for reciprocal-space mapping with femtosecond temporal resolution. In order to map out the reciprocal space, an X-ray optic with a convergent beam is used with an X-ray area detector to detect symmetrically and asymmetrically diffracted X-ray photons simultaneously. The setup is particularly suited for measuring thin films or imperfect bulk samples with broad rocking curves. For quasi-perfect crystalline samples with insignificant in-plane Bragg peak broadening, the measured reciprocal-space maps can be corrected for the known resolution function of the diffractometer in order to achieve high-resolution rocking curves with improved data quality. In this case, the resolution of the diffractometer is not limited by the convergence of the incoming X-ray beam but is solely determined by its energy bandwidth.
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