The software packageANAELUfor X-ray diffraction analysis using two-dimensional patterns

Title
The software packageANAELUfor X-ray diffraction analysis using two-dimensional patterns
Authors
Keywords
-
Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 44, Issue 1, Pages 241-246
Publisher
International Union of Crystallography (IUCr)
Online
2010-12-23
DOI
10.1107/s0021889810048739

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