Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure

Published 2010 View Full Article

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Title
Parametric Rietveld refinement for the evaluation of powder diffraction patterns collected as a function of pressure
Authors
Keywords
-
Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 43, Issue 3, Pages 504-510
Publisher
International Union of Crystallography (IUCr)
Online
2010-03-25
DOI
10.1107/s0021889810005856

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