EVAL15: a diffraction data integration method based onab initiopredicted profiles

Title
EVAL15: a diffraction data integration method based onab initiopredicted profiles
Authors
Keywords
-
Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 43, Issue 1, Pages 70-82
Publisher
International Union of Crystallography (IUCr)
Online
2009-11-30
DOI
10.1107/s0021889809043234

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