In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope

Published 2015 View Full Article

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Title
In situfabrication and optoelectronic analysis of axial CdS/p-Si nanowire heterojunctions in a high-resolution transmission electron microscope
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 26, Issue 15, Pages 154001
Publisher
IOP Publishing
Online
2015-03-23
DOI
10.1088/0957-4484/26/15/154001

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