Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 614, Issue -, Pages 379-382Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2014.06.123
Keywords
Nano-structures; Thin films; Physical properties; Electron microscopy
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Funding
- Scientific Research Commission of Mustafa Kemal University [374]
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This paper presents the effect of dextrin addition to the growth solution to prepare CuO nanostructures by SILAR method. Structural, morphological and optical properties of the films were investigated by means of XRD, SEM and UV/Vis. analysis. From the XRD data it is found that with increasing dextrin concentrations in the growth solution the crystallite size of the films decreased. SEM images showed that dextrin addition has a decreasing effect on grain size and changes the morphology drastically. By UV/Vis spectrophotometer analysis it is found that the dextrin concentration increases both the optical band gap value and the transmission rate. (C) 2014 Elsevier B.V. All rights reserved.
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