Stress and defect induced enhanced low field magnetoresistance and dielectric constant in La0.7Sr0.3MnO3 thin films

Published 2011 View Full Article

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Title
Stress and defect induced enhanced low field magnetoresistance and dielectric constant in La0.7Sr0.3MnO3 thin films
Authors
Keywords
-
Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 512, Issue 1, Pages 332-339
Publisher
Elsevier BV
Online
2011-10-16
DOI
10.1016/j.jallcom.2011.09.093

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