4.7 Article

Temperature dependent structural, luminescent and XPS studies of CdO: Ga thin films deposited by spray pyrolysis

Journal

JOURNAL OF ALLOYS AND COMPOUNDS
Volume 506, Issue 2, Pages 794-799

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2010.07.072

Keywords

Coating materials; Chemical synthesis; Gallium doped cadmium oxide; X-ray diffraction; Luminescence

Funding

  1. Department of Science and Technology (DST), New Delhi [SR/BY/P-02/2008]
  2. University Grants Commission, New Delhi, India [F-47-707/2008]

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The structural, compositional, photoluminescent and XPS properties of CdO:Ga thin films deposited at temperatures ranging from 275 to 350 degrees C, using spray pyrolysis are reported. X-ray diffraction characterization of as-deposited GCO thin films reveals that films are of cubic structure with a (2 0 0) preferred orientation. The crystalline quality of the GCO films improves and the grain size increases with deposition temperature. The EDS analyses confirm oxygen deficiency present in the film and are responsible for n-type conductivity. The photoluminescence spectra demonstrated that the green emission peaks of CdO thin films are centered at 482 nm. The relative intensity of these peaks is strongly dependent on the deposition temperature. Oxygen vacancies are dominant luminescent centers for green emission in CdO thin films. The XPS measurement shows the presence of Cd, Ga, O and C elements and confirms that CdO:Ga films are cadmium-rich. (C) 2010 Elsevier B.V. All rights reserved.

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