Depth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator

Published 2015 View Full Article

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Title
Depth Profiling Charge Accumulation from a Ferroelectric into a Doped Mott Insulator
Authors
Keywords
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Journal
NANO LETTERS
Volume 15, Issue 4, Pages 2533-2541
Publisher
American Chemical Society (ACS)
Online
2015-03-14
DOI
10.1021/acs.nanolett.5b00104

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