Nano-Scale Tensile Testing and Sample Preparation Techniques for Silicon Nanowires

Title
Nano-Scale Tensile Testing and Sample Preparation Techniques for Silicon Nanowires
Authors
Keywords
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Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 52, Issue 11R, Pages 110118
Publisher
IOP Publishing
Online
2013-10-23
DOI
10.7567/jjap.52.110118

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