Analysis of GaN Damage Induced by Cl2/SiCl4/Ar Plasma

Title
Analysis of GaN Damage Induced by Cl2/SiCl4/Ar Plasma
Authors
Keywords
-
Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 50, Issue 8S1, Pages 08JE03
Publisher
Japan Society of Applied Physics
Online
2013-12-21
DOI
10.7567/jjap.50.08je03

Ask authors/readers for more resources

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started