Application of the Meyer–Neldel Rule to the Subthreshold Characteristics of Amorphous InGaZnO4Thin-Film Transistors

Published 2009 View Full Article

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Title
Application of the Meyer–Neldel Rule to the Subthreshold Characteristics of Amorphous InGaZnO4Thin-Film Transistors
Authors
Keywords
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Journal
JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 48, Issue 7, Pages 078001
Publisher
Japan Society of Applied Physics
Online
2009-07-21
DOI
10.1143/jjap.48.078001

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