Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time

Published 2011 View Full Article

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Title
Cycle time estimation for semiconductor final testing processes with Weibull-distributed waiting time
Authors
Keywords
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Journal
INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
Volume 50, Issue 2, Pages 581-592
Publisher
Informa UK Limited
Online
2011-06-18
DOI
10.1080/00207543.2010.543938
References
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