Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy

Title
Feasibility of simultaneous surface topography and XRF mapping using Shear Force Microscopy
Authors
Keywords
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Journal
International Journal of Nanotechnology
Volume 9, Issue 3/4/5/6/7, Pages 460
Publisher
Inderscience Publishers
Online
2012-02-07
DOI
10.1504/ijnt.2012.045348

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