Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti–Al–N thin films

Published 2011 View Full Article

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Title
Electronic origin of structure and mechanical properties in Y and Nb alloyed Ti–Al–N thin films
Authors
Keywords
-
Journal
International Journal of Materials Research
Volume 102, Issue 6, Pages 735-742
Publisher
Carl Hanser Verlag
Online
2011-06-29
DOI
10.3139/146.110520

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