Design and evaluation of an ultra-area-efficient fault-tolerant QCA full adder

Published 2015 View Full Article

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Title
Design and evaluation of an ultra-area-efficient fault-tolerant QCA full adder
Authors
Keywords
Quantum-dot Cellular Automata (QCA), Full adder, Fault-tolerant gate, Defect-based fault analysis, Reliability, Probabilistic Transfer Matrix
Journal
MICROELECTRONICS JOURNAL
Volume 46, Issue 6, Pages 531-542
Publisher
Elsevier BV
Online
2015-04-24
DOI
10.1016/j.mejo.2015.03.023

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